The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jan. 29, 2016
President and Fellows of Harvard College, Cambridge, MA (US);
Shimon Jacob Kolkowitz, Cambridge, MA (US);
Arthur Safira, Somerville, MA (US);
Alexander A. High, Allston, MA (US);
Robert C. Devlin, Abington, PA (US);
Soonwon Choi, Cambridge, MA (US);
Quirin P. Unterreithmeier, Cambridge, MA (US);
David Patterson, Somerville, MA (US);
Alexander S. Zibrov, Cambridge, MA (US);
Vladimir E. Manucharyan, College Park, MD (US);
Mikhail D. Lukin, Cambridge, MA (US);
Hongkun Park, Lexington, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
A method of making measurements includes providing a sensor with at least one solid state electronic spin; irradiating the sensor with radiation from an electromagnetic radiation source that manipulates the solid state electronic spins to produce spin-dependent fluorescence, wherein the spin-dependent fluorescence decays as a function of relaxation time; providing a target material in the proximity of the sensor, wherein, thermally induced currents (Johnson noise) present in the target material alters the fluorescence decay of the solid state electronic spins as a function of relaxation time; and determining a difference in the solid state spins spin-dependent fluorescence decay in the presence and absence of the target material and correlating the difference with a property of the sensor and/or target material.