The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jun. 23, 2015
Empire Technology Development Llc, Wilmington, DE (US);
Yansong Gu, Bellevue, WA (US);
Empire Technology Development LLC, Wilmington, DE (US);
Abstract
Technologies are generally described for determination and analysis of an optical profile of a liquid-based material to implement real-time monitoring of a composition of the liquid-based material for quality control. An imaging sub-system may include a plurality of illumination sources configured to illuminate the liquid-based material with light, and one or more detectors. The detectors may be configured to detect light reflected from a first surface of the liquid-based material, light reflected from a second surface of the liquid-based material, and/or light transmitted through the first surface and the second surface of the liquid-based material in response to the illumination. An analytics sub-system coupled to the imaging sub-system may be configured to analyze the detected light to determine an optical profile of the liquid-based material, and monitor the optical profile in real-time to detect changes in the optical profile indicative of corresponding changes to a composition of the liquid-based material.