The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jun. 06, 2017
Oto Photonics Inc., Hsinchu, TW;
OTO PHOTONICS INC., Hsinchu, TW;
Abstract
An optical calibration method for a spectrum measurement device including a light-input part includes: measuring a plurality of narrow-band rays by the light-input part to obtain a plurality of narrow-band spectrum impulse responses, respectively; establishing a stray light database according to the narrow-band spectrum impulse responses; generating a correction program according to the stray light database; measuring a spectral radiant standard light by the light-input part to obtain measurement spectrum data; and generating a calibration coefficient program based on the measurement spectrum data and spectral radiant standard spectrum data, wherein the calibration coefficient program matches the measurement spectrum data with the spectral radiant standard spectrum data, and the spectral radiant standard spectrum data is obtained by measuring the spectral radiant standard light by a standard spectrum measurement device. A spectrum measurement device, an optical measurement method and an optical calibration method are also provided.