The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
May. 22, 2015
Applicant:
Quertech, Caen, FR;
Inventors:
Frederic Guernalec, Liffre, FR;
Denis Busardo, Gonneville-sur-Mer, FR;
Assignee:
IONICS FRANCE, HĂ©rouville-saint-Clair, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/00 (2006.01); C23C 14/48 (2006.01); C30B 29/20 (2006.01); C30B 33/04 (2006.01); G02B 1/11 (2015.01); G02B 1/12 (2006.01); G06F 3/044 (2006.01); G02B 1/02 (2006.01); C01F 7/02 (2006.01); G02B 1/113 (2015.01);
U.S. Cl.
CPC ...
C23C 14/0015 (2013.01); C01F 7/021 (2013.01); C23C 14/48 (2013.01); C30B 29/20 (2013.01); C30B 33/04 (2013.01); G02B 1/02 (2013.01); G02B 1/11 (2013.01); G02B 1/113 (2013.01); G02B 1/12 (2013.01); G06F 3/044 (2013.01); G06F 2203/04103 (2013.01);
Abstract
A treatment method for modifying the reflected color of a sapphire material surface comprising bombardment by a single- and/or multi-charged gas ion beam so as to modify the reflected color of the treated sapphire material surface, wherein the ions are selected from ions of the elements from the list consisting of helium (He), neon (Ne), argon (Ar), krypton (Kr), xenon (Xe), boron (B), carbon (C), nitrogen (N), oxygen (O), fluorine (F), silicon (Si), phosphorus (P) and sulphur (S).