The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Mar. 14, 2013
Applicant:
Sequenom, Inc., San Diego, CA (US);
Inventors:
Cosmin Deciu, San Diego, CA (US);
Zeljko Dzakula, San Diego, CA (US);
John Allen Tynan, San Diego, CA (US);
Grant Hogg, San Diego, CA (US);
Assignee:
Sequenom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/683 (2018.01); G06F 19/18 (2011.01); C12Q 1/6827 (2018.01); G06F 19/00 (2018.01); C12Q 1/68 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/683 (2013.01); C12Q 1/6827 (2013.01); G06F 19/18 (2013.01); C12Q 2600/156 (2013.01);
Abstract
Provided herein are methods, processes and apparatuses for determining the fraction of fetal nucleic acid in a test sample derived from a pregnant female with improved accuracy and/or precision. Also, provided herein are methods, processes and apparatuses for determining the presence or absence of a genetic variation in a fetus with improved accuracy and/or precision. Certain methods include using fetal fraction measurements for the determination of a fetal genetic variation.