The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10195579 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 05, 2019

Filed:

Oct. 01, 2015
Applicant:

Life Technologies Corporation, Carlsbad, CA (US);

Inventors:

Volker Schellenberger, Palo Alto, CA (US);

Amy Liu, Mountain View, CA (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01J 19/00 (2006.01); C40B 60/14 (2006.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
B01J 19/0046 (2013.01); B01L 3/5025 (2013.01); B01L 3/5085 (2013.01); B01L 3/50857 (2013.01); B01J 2219/0052 (2013.01); B01J 2219/00286 (2013.01); B01J 2219/00317 (2013.01); B01J 2219/00319 (2013.01); B01J 2219/00524 (2013.01); B01J 2219/00533 (2013.01); B01J 2219/00596 (2013.01); B01J 2219/00644 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00662 (2013.01); B01J 2219/00707 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0809 (2013.01); B01L 2300/161 (2013.01); C40B 60/14 (2013.01); G01N 35/1065 (2013.01); G01N 2035/00237 (2013.01);
Abstract

A method for holding samples for analysis and an apparatus thereof includes a testing plate with a pair of opposing surfaces and a plurality of holes. Each of the holes extends from one of the opposing surfaces to the other one of the opposing surfaces. The holes are arranged in groups, where each group has at least two rows and two columns of holes. The groups are arranged in sets, where each set has at least two rows and two columns of groups. To analyze samples, at least one of the opposing surfaces of the testing plate is immersed in a solution to be analyzed. A portion of the solution enters openings for each of the holes in the immersed opposing surface. Once the holes are filled with solution, the testing plate is removed and is held above a supporting surface. Surface tension holds the solution in each of the holes. The solution in one or more of the holes is then analyzed and the solution in one of these holes is identified for further study. The location of the identified solution is marked based upon its location within a particular set and group of holes.


Find Patent Forward Citations

Schellenberger, Volker. (2019). Multi-through hole testing plate for high throughput screening (U.S. Patent No. 10195579). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10195579

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