The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
May. 12, 2016
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Takahiro Masumura, Utsunomiya, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01); G01N 21/47 (2006.01); G01N 21/49 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0059 (2013.01); A61B 5/02007 (2013.01); G01N 21/4795 (2013.01); A61B 2562/0233 (2013.01); A61B 2576/00 (2013.01); G01N 21/49 (2013.01); G01N 2201/069 (2013.01);
Abstract
A control apparatus includes a data acquiring unit configured to acquire a measured signal obtained by measuring light emitted from a test object onto which light is irradiated, a processing unit configured to calculate an objective function that varies in accordance with a statistical value obtained by statistically processing the measured signal, and a controller configured to control a modulation amount of a wavefront of the light irradiated onto the test object so as to minimize the objective function.