The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Aug. 14, 2017
Applicant:
Shui T Lai, Windermere, FL (US);
Inventor:
Shui T Lai, Windermere, FL (US);
Assignee:
Other;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/028 (2006.01); A61B 3/032 (2006.01); A61B 3/036 (2006.01); A61B 3/04 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0033 (2013.01); A61B 3/0016 (2013.01); A61B 3/0041 (2013.01); A61B 3/0091 (2013.01); A61B 3/0285 (2013.01); A61B 3/032 (2013.01); A61B 3/036 (2013.01); A61B 3/04 (2013.01);
Abstract
A refraction device determines a refraction end point to provide corrective optics for a test subject. The device includes an adjustable optical system providing corrective optics to the test subject and an adjustable viewing target disposed along an optical path such as to be viewable through the adjustable optical system by a test subject. The adjustable viewing target includes a directional indicator linked synchronously to at least two choices of corrective optics presented to the test subject.