The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Feb. 22, 2016
Liang Gao, Santa Clara, CA (US);
Ivana Tosic, San Francisco, CA (US);
Noah Bedard, Pacifica, CA (US);
Liang Gao, Santa Clara, CA (US);
Ivana Tosic, San Francisco, CA (US);
Noah Bedard, Pacifica, CA (US);
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A procedure to calibrate a depth-disparity mapping for a plenoptic imaging system. In one aspect, one or more test objects located at known field positions and known depths are presented to the plenoptic imaging system. The plenoptic imaging system captures plenoptic images of the test objects. The plenoptic images include multiple images of the test objects captured from different viewpoints. Disparities for the test objects are calculated based on the multiple images taken from the different viewpoints. Since the field positions and depths of the test objects are known, a mapping between depth and disparity as a function of field position can be determined.