The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Dec. 08, 2016
Applicant:

Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;

Inventors:

Takuya Kawano, Toyokawa, JP;

Kenya Haba, Toyokawa, JP;

Assignee:

KONICA MINOLTA, INC., Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3878 (2013.01); H04N 1/00718 (2013.01); H04N 1/00737 (2013.01); H04N 1/00748 (2013.01); H04N 1/00795 (2013.01); H04N 2201/0094 (2013.01);
Abstract

A device for detecting an amount of skew in a document placed on a plate is provided. The device includes: a scanner for scanning an area including an edge of the document; a detector for detecting a boundary point between the document and the plate; a portion for setting a boundary point group of interest including boundary points; a portion for setting a midpoint of an oblique line for approximating the edge of the document; a portion for setting, as the oblique line, a line which passes through the midpoint and slants to the main scanning direction; a portion for modifying an amount of skew of the oblique line; and a portion for determining that an amount of skew in the document is an amount of skew of the oblique line having the error equal to a threshold or smaller.


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