The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Sep. 02, 2016
Applicant:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Inventors:
Byoungik Kang, Seoul, KR;
Minsoo Kim, Seoul, KR;
Wonjin Kim, Gyeonggi-do, KR;
Philkoo Yeo, Seoul, KR;
Sangchul Jung, Gyeonggi-do, KR;
Taedong Jung, Seoul, KR;
Assignee:
Samsung Electronics Co., Ltd, , KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 29/06 (2006.01); G06F 12/0813 (2016.01); H04L 12/851 (2013.01); H04W 84/10 (2009.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); G06F 12/0813 (2013.01); H04L 47/2441 (2013.01); G06F 2212/154 (2013.01); G06F 2212/60 (2013.01); G06F 2212/62 (2013.01); H04W 84/105 (2013.01); H04W 84/12 (2013.01);
Abstract
An apparatus and a method for processing data are provided. The method for processing data by a terminal. The method includes identifying a plurality of inspection types for a packet; determining at least one inspection type from the plurality of inspection types for the packet based on a predetermined criterion; and processing the determined at least one inspection type for the packet.