The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Oct. 09, 2015
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Nandu Gopalakrishnan, Chatham, NJ (US);
Yirui Hu, Piscataway, NJ (US);
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); G06K 9/62 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); G06K 9/622 (2013.01); G06K 9/6215 (2013.01); G06K 9/6219 (2013.01); G06K 9/6247 (2013.01); G06K 9/6284 (2013.01); H04L 41/0631 (2013.01); H04L 41/16 (2013.01); H04L 43/08 (2013.01); H04L 43/04 (2013.01); H04L 43/0888 (2013.01);
Abstract
A method includes receiving an anomaly data point and comparing the anomaly data point to a magnitude bounding box to produce a first comparison. The method also includes comparing the anomaly data point to a principal component analysis (PCA) bounding box to produce a second comparison and classifying the anomaly data point in accordance with the first comparison and the second comparison to produce a classification.