The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Apr. 18, 2016
Applicant:

Nyansa, Inc., Palo Alto, CA (US);

Inventors:

Murtaza Zafer, San Jose, CA (US);

Anand Srinivas, San Francisco, CA (US);

S M S Hossain, Hayward, CA (US);

Assignee:

NYANSA, INC., Palo Also, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01); H04L 29/14 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0631 (2013.01); H04L 43/08 (2013.01); H04L 67/02 (2013.01); H04L 67/10 (2013.01); H04L 67/22 (2013.01); H04L 67/2809 (2013.01); H04L 69/40 (2013.01); H04L 41/12 (2013.01); H04L 43/0823 (2013.01);
Abstract

A system and method for automatic detection of a network incident from real-time network data is disclosed. The method includes: collecting real-time network data; executing performance calculations on the real-time network data to compute performance metrics; and detecting a pattern over a time window, wherein detecting a pattern includes detecting a proportion of metric values crossing a threshold exceeding a defined percentage amount, detecting a presence of a sequence of metric values, detecting a time-ordered stretch of metric values with a length of the time-ordered stretch exceeding a defined threshold, detecting a cyclical presence of a sequence of metric values, or combinations thereof.


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