The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Jan. 05, 2018
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Minato-ku, Tokyo, JP;

Inventors:

Toshiyuki Yamagishi, Fuchu Tokyo, JP;

Tomoya Horiguchi, Inagi Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/10 (2006.01); H04L 25/49 (2006.01); H04L 7/04 (2006.01); H03M 5/12 (2006.01); G06E 1/02 (2006.01); G02B 6/293 (2006.01); H04L 27/20 (2006.01);
U.S. Cl.
CPC ...
H04L 25/4904 (2013.01); G02B 6/2932 (2013.01); G06E 1/02 (2013.01); H03M 5/12 (2013.01); H04L 7/041 (2013.01); H04L 27/2096 (2013.01);
Abstract

A semiconductor device of an embodiment includes first and second couplers, an encoding circuit, and a demodulating circuit. The encoding circuit executes differential Manchester encoding on digital data based on a clock inputted thereto via the first coupler and outputs an encoded data. The demodulating circuit includes a first sampling circuit which samples the encoded data inputted via the second coupler based on a sampling frequency set to be two times higher than that of the encoded data and which outputs first sample data, a second sampling circuit which samples the encoded data at a timing earlier than that in the first sampling circuit and which outputs second sample data, a determination circuit which determines whether or not the first and the second sample data match each other, and a selection circuit which selects first phase data or second phase data from the first sample data.


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