The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
May. 31, 2017
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventors:
Seiji Takemoto, Kobe, JP;
Takeshi Komoto, Kobe, JP;
Hideki Hirayama, Kobe, JP;
Takashi Yoshida, Kobe, JP;
James Ausdenmoore, Elgin, IL (US);
Assignee:
SYSMEX CORPORATION, Kobe-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G16H 15/00 (2018.01); G06F 3/14 (2006.01); G01N 33/49 (2006.01); G01N 33/487 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G16H 15/00 (2018.01); G01N 33/48792 (2013.01); G01N 33/49 (2013.01); G06F 3/1208 (2013.01); G06F 3/1243 (2013.01); G06F 3/1288 (2013.01); G06F 3/1407 (2013.01);
Abstract
This specimen analyzer includes: an analysis unit which analyzes a specimen collected from a subject; a print unit which prints on a print sheet; a display unit which displays an operation screen; and a controller which performs control of causing the print unit to print an analysis result of the analysis unit, and prohibiting the display unit from displaying the analysis result.