The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Mar. 27, 2017
Orbital Insight, Inc., Mountain View, CA (US);
Boris Aleksandrovich Babenko, Mountain View, CA (US);
Alexander Bogdanov Avtanski, San Jose, CA (US);
Jason D. Lohn, Los Gatos, CA (US);
ORBITAL INSIGHT, INC., Mountain View, CA (US);
Abstract
Disclosed is a method and system for processing images from an aerial imaging device. The method includes receiving a first image of a geographical area having a first resolution. The method transmits the first image to a machine learning model to identify an area of interest containing an object of interest. The method receives a second image of the geographical area having a second resolution higher than the first resolution. The method transmits the second image to the machine learning model to determine a likelihood that the area of interest contains the object of interest. The method trains the machine learning model to filter out features corresponding to the area of interest in images having the first resolution if the likelihood is below a threshold. The method transmits a visual representation of the object of interest to a user device if the likelihood exceeds the threshold.