The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Apr. 06, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Keita Nakagomi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G01C 22/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 2207/10081 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30008 (2013.01); G06T 2210/41 (2013.01);
Abstract

An image processing apparatus comprising: a division unit configured to divide, into a plurality of partial regions, a region of interest obtained from each of cross sections of a first image and a second image; a statistic information calculation unit configured to calculate statistic information of pixels included in the partial region; a degree-of-coincidence calculation unit configured to calculate a degree of coincidence between the pieces of statistic information for a partial region in the first image and a partial region in a pair of cross-sectional positions in the first image and the second image; and a specifying unit configured to specify positions of corresponding cross sections between the first image and the second image based on comparison between evaluation values each obtained by integrating the degrees of coincidence over all of the plurality of partial regions.


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