The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Dec. 22, 2014
Cognex Corporation, Natick, MA (US);
Jason Davis, Franklin, MA (US);
David J. Michael, Wayland, MA (US);
Nathaniel R. Bogan, Natlick, MA (US);
COGNEX CORPORATION, Natick, MA (US);
Abstract
This invention provides a system and method for determining the level of clutter in an image in a manner that is rapid, and that allows a scoring process to quickly determine whether an image is above or below an acceptable level of clutter—for example to determine if the underlying imaged runtime object surface is defective without need to perform a more in-depth analysis of the features of the image. The system and method employs clutter test points that are associated with regions on the image that should contain a low gradient magnitude, indicative of emptiness. This enables the runtime image to be analyzed quickly by mapping trained clutter test points at locations in the coordinate space in which lack of emptiness indicates clutter, and if detected, can rapidly indicate differences and/or defects that allow for the subject of the image to be accepted or rejected without further image analysis.