The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

May. 13, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Mitsuo Hayasaka, Tokyo, JP;

Hitoshi Kamei, Tokyo, JP;

Atsushi Sutoh, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30371 (2013.01); G06F 3/067 (2013.01); G06F 3/0608 (2013.01); G06F 3/0641 (2013.01); G06F 17/3033 (2013.01); G06F 17/30159 (2013.01); G06F 17/30342 (2013.01); G06F 17/30097 (2013.01);
Abstract

Chunk de-duplication performance is improved. A de-duplication system has a cut-out processing unit which inputs a content from a client terminal thereinto, determines a calculation range from a predetermined maximum chunk size and a predetermined minimum chunk size, divides the calculation range into at least two small calculation ranges, sets the positions of windows for rolling hash calculation so that the rolling hash calculation is continuous between the two small calculation ranges, and subjects the at least two small calculation ranges to the rolling hash calculation with shifting of the windows based on parallel processing to cut out a chunk from the content, and a de-duplication processing unit which does not store the cut-out chunk into a storage device when the chunk having the same contents as those of the cut-out chunk is already stored in the storage device.


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