The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Mar. 23, 2016
Applicant:

Keysight Technologies Singapore (Holdings) Pte. Ltd., Minneapolis, MN (US);

Inventors:

Alon Regev, Woodland Hills, CA (US);

Noah Steven Gintis, Westlake Village, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/2733 (2013.01);
Abstract

Methods, systems, and computer readable media for providing an anticipated data integrity check are disclosed. According to one method, the method includes generating a test message including an anticipated data integrity check value (ADICV), wherein the ADICV is computed using at least one value based on at least one expected modification to message data in the test message by at least one system under test (SUT), and sending the test message to the at least one SUT.


Find Patent Forward Citations

Regev, Alon. (2019). Methods, systems, and computer readable media for providing an anticipated data integrity check (U.S. Patent No. 10191826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10191826

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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