The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Dec. 29, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Yonatan Karlik, Petah-Tikva, IL;

Judah Gamliel Hahn, Ofra, IL;

Ariel Navon, Revava, IL;

Alex Bazarsky, Holon, IL;

Ofer Shapira, Herzliya, IL;

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/076 (2013.01); G06F 11/0727 (2013.01);
Abstract

A memory system is configured to perform a test operation to determine a deviation of a target storage location's bit error rate response relative to a model. The memory system determines the deviation level by measuring data sets stored in the target storage location to determine an actual bit error rate value and another actual parameter value used to estimate bit error rate. The memory system obtains an estimated value from the model based on the actual values and identifies the deviation by comparing the estimated value with the actual values.


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