The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Nov. 05, 2015
Jennifer D. T. Kruschwitz, Rochester, NY (US);
Roy S. Berns, Pittsford, NY (US);
Jennifer D. T. Kruschwitz, Rochester, NY (US);
Roy S. Berns, Pittsford, NY (US);
Rochester Institute of Technology, Rochester, NY (US);
Abstract
A spectrally selective (e.g., color) target has been designed and fabricated for reflectance micro- and/or macro-imaging that utilizes microlens arrays and color mirrors. The color mirrors are optical interference coatings. The microlenses are designed and fabricated such that the light reflected from the color mirror is incident onto the detector. This system of microlenses and color mirrors allows the user to image different colored specular highlights. An infinite number of spectral reflectance profiles can be created with these color targets and used for spectral and colorimetric imaging applications. The targets are not limited to the visible region; they can also be designed to work in the ultraviolet and infrared wavelength regions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile