The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Nov. 22, 2013
Applicant:

Bruker Biospin Mri Gmbh, Ettlingen, DE;

Inventors:

Michael Heidenreich, Karlsruhe, DE;

Jochen Franke, Karlsruhe, DE;

Volker Niemann, Ispringen, DE;

Rainer Pietig, Malsch, DE;

Assignee:

BRUKER BIOSPIN MRI GMBH, Ettlingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/385 (2006.01); A61B 5/05 (2006.01); G01R 33/48 (2006.01); A61B 5/00 (2006.01); G01R 33/38 (2006.01);
U.S. Cl.
CPC ...
G01R 33/385 (2013.01); A61B 5/0035 (2013.01); A61B 5/0515 (2013.01); G01R 33/3856 (2013.01); G01R 33/4808 (2013.01); G01R 33/3804 (2013.01);
Abstract

A device for alternating examination of a measurement object () by means of MPI and MRI with two magnetic field-generating elements is presented. The device is characterized by a main magnet coil system with two coaxial partial coil systems () arranged mirror-symmetrically relative to a central plane running perpendicularly to the z-axis through the first volume under investigation (). The volumes under investigation are superimposed. A polarity reversal device () reverses the polarity of the current through a partial coil system and the main magnet coil system generates a homogeneous magnetic field of at least sixth order in the first volume under investigation when the partial coil systems have identical polarity, and a spatially strongly varying magnetic field profile in the second volume under investigation when the polarities are opposite. Repositioning of the measurement object is thereby simplified or can even be eliminated.


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