The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Apr. 04, 2014
Applicants:

Bin He, Arden Hills, MN (US);

Jiaen Liu, Minneapolis, MN (US);

Xiaotong Zhang, St. Paul, MN (US);

Pierre-francois Van DE Moortele, Minneapolis, MN (US);

Inventors:

Bin He, Arden Hills, MN (US);

Jiaen Liu, Minneapolis, MN (US);

Xiaotong Zhang, St. Paul, MN (US);

Pierre-Francois Van de Moortele, Minneapolis, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/24 (2006.01); G01R 33/44 (2006.01);
U.S. Cl.
CPC ...
G01R 33/246 (2013.01); G01R 33/443 (2013.01);
Abstract

Systems and methods for producing an image of the electrical properties of an object using magnetic resonance imaging ('MRI') are provided. The electrical properties are determined based on estimated gradient values of the electrical properties of the object. For instance, electrical property maps are reconstructed using a spatial integration on gradient values that are estimated from the magnitude and relative phase values derived from measurements of multiple transmit and receive Bfields. Specific absorption rate ('SAR') maps can also be produced based on the estimated electrical properties.


Find Patent Forward Citations

He, Bin. (2019). Systems and methods for spatial gradient-based electrical property properties tomography using magnetic resonance imaging (U.S. Patent No. 10191126). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10191126

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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