The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Feb. 23, 2017
Globalfoundries Inc., Grand Cayman, KY;
Zhigang Song, Hopewell Junction, NY (US);
Qian Xu, Hopewell Junction, NY (US);
William Davies, Jr., Poughkeepsie, NY (US);
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Abstract
Failure types that caused defective items to fail testing are identified, the defective items are grouped by the failure types to produce failure-type groups, and the defective items are analyzed to identify defect types that caused the failures. Failure-type limited yield within each of the failure-type groups, and failure-type group-specific defect ratio based on proportions of the defect types within each of the failure-type groups are determined. Additionally, each failure-type group-specific defect ratio is weighted using the failure-type limited yield to produce a weighted failure-type group-specific defect limited yield. For each of the defect types, the weighted failure-type group-specific defect limited yield from each of the failure-type groups is combined to produce the failure-type influenced defect-type total limited yield. Matrix processing is used for the weighting and combination processes. The defect types are ranked based on the failure-type influenced defect-type total limited yield.