The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Dec. 22, 2016
Texas Instruments Incorporated, Dallas, TX (US);
Charles Kasimer Sestok, IV, Dallas, TX (US);
Srinath Ramaswamy, Murphy, TX (US);
Anand Ganesh Dabak, Plano, TX (US);
Domingo G. Garcia, Plano, TX (US);
Baher Haroun, Allen, TX (US);
Alan Henry Leek, Frisco, TX (US);
Ryan Michael Brown, Allen, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.