The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jan. 30, 2008
Applicant:
Victor B. Kley, Berkeley, CA (US);
Inventor:
Victor B. Kley, Berkeley, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 70/06 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/12 (2013.01); G01Q 70/06 (2013.01);
Abstract
A carbon nanotube or similar structure is used as the final end tip structure in a Scanning Probe Microscope to measure, modify or identify material and reentrant structures in typical recesses or very small recesses. Further the nanotube or similar structure is acoustically driven such that its locus of motion forms a dynamic reentrant probe. The nanotube is calibrated by known vertical or reentrant structures.