The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

May. 11, 2017
Applicants:

Ibrahim Tansel, Coral Gables, FL (US);

Volkan Senyurek, Miami, FL (US);

Muhammed Unal, Miami, FL (US);

Amin Baghalian, Miami, FL (US);

Shervin Tashakori, Miami, FL (US);

Inventors:

Ibrahim Tansel, Coral Gables, FL (US);

Volkan Senyurek, Miami, FL (US);

Muhammed Unal, Miami, FL (US);

Amin Baghalian, Miami, FL (US);

Shervin Tashakori, Miami, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/4445 (2013.01); G01N 2291/0289 (2013.01);
Abstract

Systems and methods for implementation of the heterodyne effect in structural health monitoring (SHM) systems are provided. A system or method can include propagating a first signal with a first frequency and a second signal with a second frequency through a subject structure, and analyzing the output response to determine if a third frequency has been created, according to the heterodyne effect.


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