The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jul. 16, 2014
Nikon Corporation, Tokyo, JP;
Takashi Aoki, Sagamihara, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
There is provided an X-ray device irradiating a measuring object with X-ray and detecting transmission X-ray transmitted through the measuring object, the X-ray device including: a first information generation portion configured to generate first information in which a value according to an absorption coefficient is allocated to each of a plurality of divided sections into which there is divided a predetermined space including at least part of the measuring object; a frequency generation portion configured to generate frequency information of the allocated value to indicate a number of the divided sections according to magnitude of the allocated value in the first information; a ratio acquirement portion configured to acquire ratio information indicating a ratio between a first substance and a second substance constituting the measuring object; and a second information generation portion configured to change the first information into second information, by using the frequency information and the ratio information.