The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Nov. 11, 2015
Korea Institute of Industrial Technology, Cheonan-si, Chungcheongnam-do, KR;
Hyo Soo Lee, Incheon, KR;
Hyouk Chon Kwon, Seoul, KR;
Hai Joong Lee, Incheon, KR;
Heong Won Shin, Incheon, KR;
Korea Institute of Industrial Technology, Cheonan-si, Chungcheongnam-do, KR;
Abstract
The present invention relates to a method for analyzing the color of a color alloy and, more particularly, to a method for analyzing the color of a color alloy wherein, on the basis of the fact that a different color appears according to the composition of an alloy, the wavelength-wise reflectance related to a color, which is held according to each alloy composition, and that related to a color, which is held by a measurement object that is to be measured, are compared, thereby determining the color held by the measurement object.