The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Jan. 31, 2014
Applicant:

Becton Dickinson and Company, Franklin Lakes, NJ (US);

Inventors:

Joseph Trotter, La Jolla, CA (US);

Sujata Iyer, San Jose, CA (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 15/14 (2006.01); G06G 7/58 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); G01N 15/1404 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/149 (2013.01);
Abstract

Methods and systems are disclosed for generating an entrainment factor in a flow cytometry sample. The methods comprise flowing a sample with a series of particles through the flow cytometer, detecting events and calculating an expected frequency of those events based on a distribution, such as a Poisson distribution, and measuring an observed frequency of particle events. An entrainment factor may be generated from a ratio of observed event frequency to expected event frequency. Further adjustment to the flow cytometer maybe performed based on the indicated entrainment factor such as adjusted sorting bias.


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