The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jan. 22, 2015
Applicant:
Microtracbel Corp., Osaka, JP;
Inventors:
Kazuyuki Nakai, Osaka, JP;
Hiromi Yamazaki, Osaka, JP;
Kaori Nakamura, Osaka, JP;
Takayuki Goumoto, Osaka, JP;
Assignee:
MicrotracBEL Corp., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/26 (2006.01); G01N 9/02 (2006.01);
U.S. Cl.
CPC ...
G01N 9/26 (2013.01); G01N 9/02 (2013.01); G01N 2009/028 (2013.01);
Abstract
This true density measurement device is a device that is used to measure the true density of a sample by a gas phase substitution method, and is provided with: a sample chamber for accommodating the sample, the sample chamber being pressurized through the introduction of an inert gas; and an expansion chamber into which is released the inert gas filling the sample chamber. The expansion chamber under conditions of normal use, is opened and closed by a detachable cover, and the volume thereof is modified by insertion or withdrawal of a volume modification member.