The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Oct. 19, 2015
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/01 (2006.01); G01K 7/28 (2006.01); G01K 13/00 (2006.01); B81B 3/00 (2006.01); B81B 7/00 (2006.01); G01K 7/02 (2006.01); G01K 7/42 (2006.01);
U.S. Cl.
CPC ...
G01K 13/002 (2013.01); A61B 5/01 (2013.01); B81B 3/0081 (2013.01); B81B 7/0019 (2013.01); G01K 7/028 (2013.01); G01K 7/427 (2013.01);
Abstract
Provided is an internal temperature measurement device capable of measuring an internal temperature of a measuring object for which the thermal resistance value of a non-heating body present on the surface side of the object is unknown, more accurately with better responsiveness than hitherto. The internal temperature measurement deviceincludes a MEMS chipincluding: two cellsfor measuring two heat fluxes for calculating an internal temperature of a measuring object for which the thermal resistance value of a non-heating body is unknown; and a cellfor increasing a difference between the heat fluxes.