The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Feb. 03, 2015
Applicant:

B. G. Negev Technologies and Applications Ltd., AT Ben-gurion University, Beer Sheva, IL;

Inventors:

Avner Safrani, Kibbutz Ein Dor, IL;

Ibrahim Abdulhalim, Wahat-Alsalam-Neve Shalom, IL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01B 9/02 (2006.01); G02B 27/10 (2006.01); G02B 21/22 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02081 (2013.01); G01B 9/02091 (2013.01); G02B 21/0056 (2013.01); G02B 21/0092 (2013.01); G02B 21/22 (2013.01); G02B 21/26 (2013.01); G02B 27/10 (2013.01); G01B 2290/70 (2013.01);
Abstract

The invention is a system and method that enable obtaining ultra-high resolution interference, phase and OCT images at high speed. The system uses neither mechanical moving elements nor any optical/electro optical modulating means for obtaining the OCT images. Two OCT operating modes are available: for ultra-high resolution the system allows either spatial coherence TD-FF-OCT or temporal coherence TD-FF-OCT imaging, whereas for high resolution and ultra-high speed the system allows FD-FF-OCT imaging with full range imaging. In the TD mode, the OCT enface images are obtained in real time. In the FD mode, the 2D complex signal is reconstructed in real time. In both cases the method has the advantage of very high speed imaging with great immunity to noise.


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