The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Dec. 11, 2015
Compagnie Generale Des Establissements Michelin, Clermont-Ferrand, FR;
Michelin Recherche ET Technique S.a., Granges-Paccot, CH;
Thomas Ledoux, Clermont-Ferrand, FR;
Denis Martin, Clermont-Ferrand, FR;
Alexandre Pernot, Clermont-Ferrand, FR;
Guillaume Heredia, Clermont-Ferrand, FR;
Patrick Meneroud, Meylan, FR;
Cédric Goeau, Meylan, FR;
Compagnie Generale des Etablissements Michelin, Clermont-Ferrand, FR;
Abstract
A method is provided for measuring a thickness of a layer of rubber-like material. The layer of rubber-like material includes a free face in contact with air and a face joined to an adjacent reinforcement made of elements electrically insulated from one another. Each of the elements includes at least one hysteretic material having a magnetic permeability greater than the magnetic permeability of air. According to the method, a sensitive element, which emits an alternating magnetic field, is brought towards the layer of rubber-like material whose thickness is to be measured, hysteretic losses in the adjacent reinforcement are measured at terminals of the sensitive element, and a thickness of the layer of rubber-like material is evaluated based on the hysteretic losses.