The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jun. 30, 2015
Big Daishowa Co., Ltd., Osaka, JP;
Masataka Yauchi, Osaka, JP;
Kouichi Uemura, Osaka, JP;
Reina Oohashi, Osaka, JP;
Shunsuke Kumasaki, Osaka, JP;
Akihito Funashoku, Osaka, JP;
Big Daishowa Co., Ltd., Osaka, JP;
Abstract
There is provided a tool shape measuring apparatus that allows detection of shape abnormality in a tool having a plurality of cutting edges with a simple configuration. A light receiving sectionincludes a light receiving faceperpendicular to an optical axisof a light receiving lens. In the light receiving face, there are disposed a plurality of line sensorsarranged in different directions from each other, each line sensor having a plurality of sensor elements arranged in one direction. The line sensoris disposed across a first area not reached by the irradiation light L as being completely blocked by the tool, a second area disposed adjacent the first area and reached by the irradiation light L with a portion thereof being blocked, and a third area disposed adjacent the second area and reached by the irradiation light L not blocked at all. A calculation sectionchecks change occurring in output states of the line sensorassociated with rotation of the tooland specifies a contour position of the toolbased on a center position in the second area when the number of the sensor elements included in the second area becomes minimal.