The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Dec. 26, 2012
Applicant:

The University of Vermont and State Agriculture College, Burlington, VT (US);

Inventors:

Kathleen B. Ziedins, Waterbury Center, VT (US);

Christopher M. Danforth, Burlington, VT (US);

Thomas Orfeo, Colchester, VT (US);

Stephen J. Everse, South Burlington, VT (US);

Kenneth G. Mann, Colchester, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01); C12Q 1/56 (2006.01); G01N 33/86 (2006.01); A61B 5/021 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/02042 (2013.01); A61B 5/021 (2013.01); A61B 5/02028 (2013.01); A61B 5/14535 (2013.01); A61B 5/14546 (2013.01); A61B 5/4848 (2013.01); A61B 5/7246 (2013.01); A61B 5/7278 (2013.01); A61B 5/7282 (2013.01); A61B 5/742 (2013.01); C12Q 1/56 (2013.01); G01N 33/86 (2013.01); G01N 2800/60 (2013.01);
Abstract

Featured is a method for assessing risk of a patient condition. Such a method includes providing criteria that relate predetermined parameters to each other, inputting observations into given criterion and relating observations of one or more acquired parameters, and converging the given criterion so as to provide an output representative of a patient condition. Such a method further includes translating the output into a visual form such as displaying the output on a display device.


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