The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Sep. 30, 2016
Amo Wavefront Sciences, Llc, Santa Ana, CA (US);
Richard J. Copland, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
Stephen W. Farrer, Albuquerque, NM (US);
AMO WaveFront Sciences, LLC, Santa Ana, CA (US);
Abstract
An optical measurement system method for measuring a characteristic of a subject's eye use a probe beam having an infrared wavelength in the infrared spectrum to measure a refraction of the subject's eye at the infrared wavelength; capture at least two different Purkinje images at two different corresponding wavelengths from at least one surface of the lens of the subject's eye; determine from the at least two different Purkinje images a value for at least one parameter of the subject's eye; use the value of the at least one parameter to determine a customized chromatic adjustment factor for the subject's eye; and correct the measured refraction of the subject's eye at the infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the subject's eye at a visible wavelength in the visible spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile