The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jun. 12, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Eiichi Fujii, Kamakura, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); G01B 9/02 (2006.01); H01S 5/183 (2006.01); A61B 3/12 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/1225 (2013.01); G01B 9/02004 (2013.01); G01B 9/02091 (2013.01); G02B 26/105 (2013.01); G02B 26/106 (2013.01); H01S 5/18366 (2013.01); G01B 2290/65 (2013.01);
Abstract
To acquire information on sections of an object with high accuracy even if the area to be imaged with a single scan is wide. A scanning unit is configured such that an angle of linear scanning of a fundus with illuminating light is 47 degrees or greater in the air. A light-source unit 10 includes a MEMS-VCSEL 601 whose coherence length during the sweeping of the frequency of the light is 14 or longer.