The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Nov. 10, 2016
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Michihiro Takii, Aichi, JP;

Masaaki Hanebuchi, Aichi, JP;

Hisashi Ochi, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/032 (2006.01); A61B 3/00 (2006.01); A61B 3/04 (2006.01); A61B 3/103 (2006.01); A61B 3/18 (2006.01); G02B 27/00 (2006.01); A61B 3/02 (2006.01); A61B 3/028 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01); A61B 3/0008 (2013.01); A61B 3/0025 (2013.01); A61B 3/0041 (2013.01); A61B 3/0075 (2013.01); A61B 3/02 (2013.01); A61B 3/028 (2013.01); A61B 3/04 (2013.01); A61B 3/10 (2013.01); A61B 3/103 (2013.01); A61B 3/18 (2013.01); G02B 27/0068 (2013.01);
Abstract

A subjective optometry apparatus includes: a subjective measurer including a light projecting optical system, a corrective optical system including a right-eye corrective optical system and a left-eye corrective optical system, and an optical member for guiding the target light flux corrected by the corrective optical system to an examinee's eye, the subjective measurer subjectively measuring an optical characteristic of the examinee's eye; and an objective measurer including a measurement optical system for emitting measurement light to a fundus of the examinee's eye and for receiving reflected light from the fundus, the objective measurer objectively measuring the optical characteristic of the examinee's eye via the optical member disposed on an optical path of the measurement optical system.


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