The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Nov. 06, 2017
Applicant:
Thetaray Ltd., Hod HaSharon, IL;
Inventors:
Amir Averbuch, Tel Aviv, IL;
Ronald R. Coifman, North Haven, CT (US);
Gil David, Zichron-Yaakov, IL;
Assignee:
ThetaRay Ltd., Hod Hasharon, IL;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); H04L 63/145 (2013.01);
Abstract
Detection of abnormalities in multi-dimensional data is performed by processing the multi-dimensional data to obtain a reduced dimension embedding matrix, using the reduced dimension embedding matrix to form a lower dimension (of at least 2D) embedded space, applying an out-of-sample extension procedure in the embedded space to compute coordinates of a newly arrived data point and using the computed coordinates of the newly arrived data point and Euclidean distances to determine whether the newly arrived data point is normal or abnormal.