The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Aug. 03, 2018
Infinera Corporation, Sunnyvale, CA (US);
Shah Sharif, San Jose, CA (US);
Infinera Corporation, Sunnyvale, CA (US);
Abstract
Methods and apparatuses are described herein for metastability error detection and correction in analog-to-digital converters (ADCs). For example, an ADC may comprise a comparator, a register circuit, a first circuit, and a second circuit. The comparator may generate a comparator output signal in response to a sampling clock signal. The register circuit, operatively coupled to the comparator, may process the comparator output signal. The first circuit, operatively coupled to the comparator and the register circuit may generate a plurality of first output bits that include a bit indicating a metastability error on a condition that the metastability error occurred during the bit conversion. The second circuit, operatively coupled to the first circuit, may generate a plurality of second output bits indicating a location of the metastability error. The plurality of second output bits may be sampled using first and second groups in response to the sampling clock signal.