The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

May. 24, 2016
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Maria Fortuna Bevilacqua, Sant-Agata de Goti, IT;

Flavio Francesco Villa, Milan, IT;

Rossana Scaldaferri, Sapri, IT;

Valeria Casuscelli, Naples, IT;

Andrea Di Matteo, Naples, IT;

Dino Faralli, Milan, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/09 (2006.01); H01L 41/053 (2006.01); H01L 41/22 (2013.01); H01L 41/113 (2006.01); H01L 41/047 (2006.01); H02N 2/18 (2006.01); H01L 41/187 (2006.01); H01L 41/25 (2013.01); H01L 41/29 (2013.01); H01L 41/332 (2013.01);
U.S. Cl.
CPC ...
H01L 41/1138 (2013.01); H01L 41/047 (2013.01); H01L 41/053 (2013.01); H01L 41/1134 (2013.01); H01L 41/1876 (2013.01); H01L 41/22 (2013.01); H01L 41/25 (2013.01); H01L 41/29 (2013.01); H01L 41/332 (2013.01); H02N 2/186 (2013.01);
Abstract

A MEMS piezoelectric device includes a monolithic semiconductor body having first and second main surfaces extending parallel to a horizontal plane formed by first and second horizontal axes. A housing cavity is arranged within the monolithic semiconductor body. A membrane is suspended above the housing cavity at the first main surface. A piezoelectric material layer is arranged above a first surface of the membrane with a proof mass coupled to a second surface, opposite to the first surface, along the vertical axis. An electrode arrangement is provided in contact with the piezoelectric material layer. The proof mass causes deformation of the piezoelectric material layer in response to environmental mechanical vibrations. The proof mass is coupled to the membrane by a connection element arranged, in a central position, between the membrane and the proof mass in the direction of the vertical axis.


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