The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Oct. 31, 2014
Applicant:

Shindengen Electric Manufacturing Co., Ltd., Chiyoda-ku, Tokyo, JP;

Inventor:

Atsushi Ogasawara, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/29 (2006.01); H01L 21/033 (2006.01); C03C 3/091 (2006.01); C03C 3/093 (2006.01); H01L 21/308 (2006.01); H01L 29/868 (2006.01); C09K 13/08 (2006.01); H01L 21/285 (2006.01); H01L 21/311 (2006.01); H01L 29/66 (2006.01); H01L 29/861 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0332 (2013.01); C03C 3/091 (2013.01); C03C 3/093 (2013.01); C09K 13/08 (2013.01); H01L 21/0335 (2013.01); H01L 21/0337 (2013.01); H01L 21/28568 (2013.01); H01L 21/308 (2013.01); H01L 21/31111 (2013.01); H01L 21/31144 (2013.01); H01L 29/66136 (2013.01); H01L 29/868 (2013.01); H01L 29/8611 (2013.01); H01L 29/8613 (2013.01);
Abstract

In a method of manufacturing a semiconductor device having an oxide film removing step where an oxide film formed on a surface of a semiconductor substrate is partially removed, the oxide film removing step includes: a first step where a resist glass layer is selectively formed on an upper surface of the oxide film without using an exposure step; a second step where the resist glass layer is densified by baking the resist glass layer; and a third step where the oxide film is partially removed using the resist glass layer as a mask, wherein the resist glass layer is made of resist glass which contains at least SiO, BO, AlO, and at least two oxides of alkaline earth metals selected from a group consisting of CaO, MgO and BaO, and substantially contains none of Pb, As, Sb, Li, Na, K, and Zn.


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