The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Oct. 09, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Hao Wu, Beijing, CN;

Na An, Beijing, CN;

Xuzhong Liu, Beijing, CN;

Zongwei Luo, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/36 (2006.01); G01B 7/16 (2006.01); G02F 1/13 (2006.01); F21V 8/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01B 7/22 (2013.01); G02F 1/1309 (2013.01); G02B 6/0011 (2013.01); G09G 3/3607 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0626 (2013.01); G09G 2320/0693 (2013.01); G09G 2330/12 (2013.01);
Abstract

A method for adjusting brightness includes detecting whether damage occurs on a light guide plate of the display device, determining a damage position and a damage extent of the light guide plate when the damage occurs on the light guide plate, and compensating for a change value of brightness generated due to the damage by adjusting the brightness of the display device corresponding to the damage position, according to a predetermined correspondence between damage extents and change values of brightness. The method for testing a display device includes applying a destructive operation to the display device to be tested, detecting a damage extent generated by the destructive operation and a change value of brightness correspondingly generated in a damage region, and creating and storing a correspondence between the damage extent and the change value of brightness.


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