The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Mar. 20, 2009
Applicants:
Raj B. Apte, Palo Alto, CA (US);
Jeng Ping LU, San Jose, CA (US);
Jackson H. Ho, Palo Alto, CA (US);
Inventors:
Raj B. Apte, Palo Alto, CA (US);
Jeng Ping Lu, San Jose, CA (US);
Jackson H. Ho, Palo Alto, CA (US);
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/00 (2006.01); G09G 3/00 (2006.01); G01R 31/308 (2006.01); G09G 3/3208 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/308 (2013.01); G09G 3/3208 (2013.01); G09G 2360/147 (2013.01);
Abstract
A backplane test system is provided that uses a pressed or deposited resistive film and infra-red (IR) imaging to visualize and quantify the current drive of pixels. In one form, the system is used for measuring organic light-emitting-diode (OLED) backplanes or other current-actuated-display (CAD) backplanes.