The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Apr. 26, 2018
Applicant:

Intermap Technologies Inc., Englewood, CO (US);

Inventors:

Nathan Zachary Mercer, Englewood, CO (US);

Stephen Charles Griffiths, Englewood, CO (US);

Michael John Wollersheim, Englewood, CO (US);

Trevor Roy Miller, Englewood, CO (US);

Qiaoping Zhang, Englewood, CO (US);

Assignee:

Intermap Technologies Inc., Englewood, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 5/10 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/40 (2013.01); A61B 6/5258 (2013.01); G06T 3/4053 (2013.01); G06T 5/002 (2013.01); G06T 5/10 (2013.01); G06T 5/50 (2013.01); G06T 2207/20032 (2013.01); G06T 2207/20182 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/20224 (2013.01);
Abstract

Systems and methods of enhancing the resolution or restoring details associated with high resolution images into a filtered digital surface model (DSM) for location-based applications and analyses. The disclosed methods include mapping the changing gray scale values (intensity) from the images to changes in elevation in the DSM using a regression over a local neighborhood of pixels. Further, the disclosed methods do not rely on information about the sensor illumination geometry, and are extendable to be able to utilize any types of images. Additionally, the disclosed embodiments are sensor agnostic. That is, the disclosed methods can be applied on any type of images collected by any type of sensor.


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