The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

May. 04, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Jingchen Wu, Seattle, WA (US);

Zhihao Cen, Bellevue, WA (US);

Jingqiao Zhang, Redmond, WA (US);

Jeffrey B. Maurer, Port Orchard, WA (US);

Deepak Bhatia, Issaquah, WA (US);

Ali Sadighian, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/06 (2012.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0605 (2013.01); G06Q 10/087 (2013.01);
Abstract

Techniques for computing a feature based on variables may be provided. For example, historical realizations associated with a first variable may be accessed. The first variable may be associated with an item. Realizations of the first variable may be based on one or more factors associated with the item. Historical realization of a second variable associated with the item may also be accessed. The historical realizations of the first and second variables may be analyzed to generate an expected realization of the first variable as a function of the second variable. The feature may be computed based on the generated function.


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