The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
May. 30, 2014
Amazon Technologies, Inc., Reno, NV (US);
Pragyana K. Mishra, Seattle, WA (US);
David Joseph Rendleman, Seattle, WA (US);
Jonathan Robert Dughi, Seattle, WA (US);
Danny Guan, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Diagnostics may be performed on imaging devices such as digital cameras that are provided in large numbers, or mounted in arrays or networks, by providing imaging data captured from such devices to a machine learning system or classifier that has been trained to recognize anomalies based on imaging data. The machine learning system or classifier may be trained using a training set of imaging data previously captured by one or more imaging devices that has been labeled with regard to whether such imaging devices encountered any anomalies when the imaging data was captured, and if so, which anomalies were encountered. Additionally, a perceptual score which represents the quality of a given image or imaging data may be calculated and used to rank or define the image or imaging data in terms of quality, or determine whether the image or imaging data is suitable for its intended purpose.