The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Sep. 07, 2016
Applicant:

Apple, Inc., Cupertino, CA (US);

Inventors:

Krasimir D. Kolarov, Cupertino, CA (US);

Bjorn S. Hori, Cupertino, CA (US);

Rahul Gopalan, Cupertino, CA (US);

Steven E. Saunders, Cupertino, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/77 (2017.01); G06K 9/03 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/036 (2013.01); G06K 9/00577 (2013.01); G06K 9/6201 (2013.01); G06K 9/628 (2013.01); G06T 7/0002 (2013.01); G06T 7/0018 (2013.01); G06T 7/0081 (2013.01); G06K 2009/6213 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A video quality assessment method may include frame-by-frame analysis of a test video sequence (often compressed) with its original (reference) counterpart, pre-conditioning elements of the test and reference frames, defining a region of interest in the pre-conditioned test frame and estimating relative errors within the region of interest between the test and reference frame, filtering the estimated errors of the region of interest temporally across adjacent frames within a perpetually relevant time window, aggregating the filtered errors within the time window, ranking the aggregated errors, selecting a subset of the ranked errors, aggregating across the selected subset of errors, and inputting said aggregated error to a quality assessment system to determine a quality classification along with an estimated quality assessment.


Find Patent Forward Citations

Loading…